Topics
Electric Charges and Fields
- Electric Charge
- Conductors and Insulators
- Basic Properties of Electric Charge
- Coulomb’s Law
- Forces between Multiple Charges
- Electric Field
- Electric Field Due to a System of Charges
- Physical Significance of Electric Field
- Electric Field Lines
- Electric Flux
- Electric Dipole
- Dipole in a Uniform External Field
- Continuous Charge Distribution
- Gauss’s Law
- Application of Gauss' Law
Electrostatics
Current Electricity
Electrostatic Potential and Capacitance
- Electric Potential and Potential Energy
- Electrostatic Potential
- Electric Potential Due to a Point Charge
- Potential Due to an Electric Dipole
- Potential due to a System of Charges
- Equipotential Surfaces
- Relation Between Electric Field and Electrostatic Potential
- Potential Energy of a System of Charges
- Potential Energy of a Single Charge
- Potential Energy of a System of Two Charges in an External Field
- Potential Energy of a Dipole in an External Field
- Electrostatics of Conductors
- Dielectrics and Polarisation
- Capacitors and Capacitance
- The Parallel Plate Capacitor
- Effect of Dielectric on Capacitance
- Combination of Capacitors
- Energy Stored in a Charged Capacitor
Magnetic Effects of Current and Magnetism
Current Electricity
- Electric Current
- Electric Currents in Conductors
- Ohm's Law
- Drift of Electrons and the Origin of Resistivity
- Mobility of Electrons
- Limitations of Ohm’s Law
- Resistivity of Various Materials
- Temperature Dependence of Resistivity
- Electrical Energy and Power in Conductors
- Cells, EMF, and Internal Resistance
- Cells in Series and in Parallel
- Kirchhoff’s Laws
- Wheatstone Bridge
Electromagnetic Induction and Alternating Currents
Moving Charges and Magnetism
- Electromagnetism
- Magnetic force
- Motion in a Magnetic Field
- Magnetic Field Due to a Current Element, Biot-savart Law
- Magnetic Field on the Axis of a Circular Current-Carrying Loop
- Ampere’s Circuital Law
- Solenoid
- Force Between Two Parallel Currents (Ampere’s Law)
- Torque on a Rectangular Current Loop in a Uniform Magnetic Field
- Circular Current Loop as a Magnetic Dipole
- Moving Coil Galvanometer
- Kirchhoff’s Laws
Electromagnetic Waves
Magnetism and Matter
Electromagnetic Induction
Optics
Dual Nature of Radiation and Matter
Alternating Current
Atoms and Nuclei
Electromagnetic Waves
Electronic Devices
Ray Optics and Optical Instruments
- Ray Optics Or Geometrical Optics
- Reflection of Light by Spherical Mirrors
- Sign Convention for Reflection by Spherical Mirrors
- Focal Length of Spherical Mirrors
- Mirror Equation of Spherical Mirrors
- Refraction of Light
- Total Internal Reflection
- Applications of Total Internal Reflection
- Refraction at a Spherical Surfaces
- Refraction by a Lens
- Power of a Lens
- Combined Focal Length of Two Thin Lenses in Contact
- Refraction of Light Through a Prism
- Optical Instruments
- Microscope and it’s types
- Telescope
- Overview of Ray Optics and Optical Instruments
Wave Optics
- Concept of Wave Optics
- Huygens Principle
- Refraction of a Plane Wave
- Refraction at a Rarer Medium
- Reflection of a Plane Wave by a Plane Surface
- Coherent and Incoherent Addition of Waves
- Interference of Light Waves and Young’s Experiment
- Diffraction of Light
- The Single Slit
- Seeing the Single Slit Diffraction Pattern
- Polarisation of Light
- Overview: Wave Optics
Communication Systems
The Special Theory of Relativity
Dual Nature of Radiation and Matter
- Understanding Dual Nature of Radiation and Matter
- Electron Emission
- Photoelectric Effect - Hertz’s Observations
- Photoelectric Effect - Hallwachs’ and Lenard’s Observations
- Experimental Study of Photoelectric Effect
- Effects of Intensity and Frequency on Photocurrent
- Photoelectric Effect and Wave Theory of Light
- Einstein’s Photoelectric Equation: Energy Quantum of Radiation
- Particle Nature of Light: The Photon
- Wave Nature of Matter
- Overview: Dual Nature of Radiation and Matter
Atoms
Nuclei
- Atomic Masses and Composition of Nucleus
- Size of the Nucleus
- Mass - Energy
- Nuclear Binding Energy
- Nuclear Force
- Radioactivity
- Forms of Energy > Nuclear Energy
- Nuclear Fission
- Nuclear Fusion
- Controlled Thermonuclear Fusion
- Overview: Nuclei
Semiconductor Electronics - Materials, Devices and Simple Circuits
- Concept of Semiconductor Electronics
- Classification of Metals, Conductors and Semiconductors
- Intrinsic Semiconductor
- Extrinsic Semiconductor
- n-type Semiconductor
- p-type Semiconductor
- Diode or p-n Junction
- Semiconductor Diode
- Application of Junction Diode as a Rectifier
- Overview: Semiconductor Electronics
Communication Systems
- Detection of Amplitude Modulated Wave
- Production of Amplitude Modulated Wave
- Basic Terminology Used in Electronic Communication Systems
- Sinusoidal Waves
- Modulation and Its Necessity
- Amplitude Modulation (AM)
- Need for Modulation and Demodulation
- Satellite Communication
- Propagation of EM Waves
- Bandwidth of Transmission Medium
- Bandwidth of Signals
The Special Theory of Relativity
- The Special Theory of Relativity
- The Principle of Relativity
- Maxwell'S Laws
- Kinematical Consequences
- Dynamics at Large Velocity
- Energy and Momentum
- The Ultimate Speed
- Twin Paradox
Definition: Single Slit Diffraction
When light passes through a single narrow slit, it spreads out and produces a pattern of alternating bright and dark bands on a screen. This spreading of light is called diffraction.
Experimental Setup

Key elements of the setup:
- Slit LN of width a*, with midpoint M
- A screen placed at a large distance
- C = point on the screen along the normal to the slit
- P = any point on the screen at angle θ from the normal
- Light from every small part of the slit acts as a secondary source; all secondary sources within the slit are in phase with each other
The Diffraction Pattern
The single-slit diffraction pattern has the following characteristics:
- A broad, bright central maximum at the centre of the screen (at point C, along the normal)
- Alternating dark and bright regions on either side of the central maximum
- The bright regions (secondary maxima) have progressively decreasing intensity as you move away from the centre
- Dark fringes (minima) separate the bright regions

Derivation — Conditions for Minima and Maxima
Every point within the slit of width a acts as a secondary source of Huygens' wavelets. To find dark and bright fringes, the slit is divided into equal halves, and rays from corresponding points in each half are compared for their path difference.
Step-by-Step: Condition for Central Maximum
- At θ = 0 (point C on the normal), all secondary sources are at equal distances from C
- All path differences = 0
- All wavelets arrive in phase → constructive superposition
- Result: Central maximum at θ = 0 — this is the brightest point
Step-by-Step: Condition for Minima (Dark Fringes)
Divide the slit into two equal halves. For any ray from the top half, there is a corresponding ray from the bottom half. When the path difference between these paired rays equals λ/2, they cancel (destructive interference).
For the slit of width a, the path difference between rays from the top and middle of the slit:
- Path difference = \[\frac {a}{2}\] sin θ
For destructive interference: path difference = \[\frac {λ}{2}\]
- \[\frac {a}{2}\] sin θ = \[\frac {λ}{2}\] ⇒ a sin θ = λ
Generalising by dividing the slit into 2n equal parts:
Condition for Secondary Maxima
Between consecutive minima, there are bright fringes (secondary maxima). These occur approximately at:
- a sin θ ≈ (n + \[\frac {1}{2}\])λ, n = ±1, ±2, ...
These secondary maxima have much lower intensity than the central maximum because a significant portion of the slit still cancels out.
Intensity Distribution
- The intensity is maximum at the centre (θ = 0) and falls off on both sides
- Secondary maxima exist between the minima but are significantly weaker
- The pattern is symmetric about the central maximum
- As n increases, the intensity of the secondary maxima keeps decreasing.
